1876247

ISO 22493:2014

Microbeam analysis - Scanning electron microscopy - Vocabulary

standard by International Organization for Standardization , 04/15/2014

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Full Description

ISO 22493:2014 defines terms used in the practice of scanning electron microscopy (SEM). It covers both general and specific concepts, classified according to their hierarchy in a systematic order, with those terms that have already been defined in ISO 23833 also included, where appropriate.

ISO 22493:2014is applicable to all standardization documents relevant to the practice of SEM. In addition, some clauses of ISO 22493:2014 are applicable to documents relevant to related fields (e.g. EPMA, AEM, EDS) for the definition of terms which are relevant to such fields.

 

Product Details

Published:
04/15/2014
Number of Pages:
28
File Size:
1 file , 500 KB
Same As:
BS ISO 22493:2014
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This product is unavailable in Ukraine, Russia, Belarus
 

Document History

  1. ISO 22493:2014

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    Microbeam analysis - Scanning electron microscopy - Vocabulary

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  2. ISO 22493:2008


    Microbeam analysis - Scanning electron microscopy - Vocabulary

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