Popular Standards |
|
EIA SP 3275 | DETAIL SPECIFICATION FOR 8-BYTE, 168 POSITION DUAL IN-LINE MEMORY MODULE SOCKETS (DIMM), 1.27 MM PITCH, VERTICAL MOUNT |
EIA SP 3276 | GENERIC SPECIFICATION FOR SOCKETS FOR USE IN ELECTRONIC EQUIPMENT |
EIA SP 3297 | CONTINUITY TEST PROCEDURE FOR ELECTRICAL CONNECTORS |
EIA SP 3298 | LIFE TEST PROCEDURE FOR ELECTRICAL CONNECTORS |
EIA SP 3299 | ACCELERATION TEST PROCEDURE FOR ELECTRICAL CONNECTORS |
EIA SP 3301 | GENERAL PERFORMANCE REQUIREMENTS |
EIA SP 3302 | TEST PROCEDURE FOR DETERMINATION OF GAS-TIGHT CHARACTERISTICS FOR ELECTRICAL CONNECTORS, SOCKETS AND/OR CONTACT SYSTEM |
EIA SP 3303 | MIXED FLOWING GAS |
EIA SP 3322 | DETAIL SPECIFICATION FOR BLIND-MATE, SCOOP PROOF, LARGE, RECTANGULAR ELECTRICAL CONNECTORS FOR SPACECRAFT USE IN HABIT |
EIA SP 3323 | DETAIL SPECIFICATION FOR BLIND-MATE, SCOOP PROOF, SMALL, RECTANGULAR ELECTRICAL CONNECTORS FOR SPACECRAFT USE IN HABIT |
EIA SP 3329 | DETAIL SPECIFICATION FOR 1.0 MILLIMETER, TWO-PART CONNECTORS FOR USE WITH PARALLEL PRINTED BOARDS |
EIA SP 3391 | SECTIONAL SPECIFICATION FOR DISCRETE CONTACTS OF CERTIFIED QUALITY |
EIA SP 3402 | GENERIC SPECIFICATION FOR SPECIAL-USE ELECTROMECHANICAL SWITCHES OF CERTIFIED QUALITY |
EIA SP 3404 | CROSSTALK RATIO TEST PROCEDURE FOR ELECTRICAL CONNECTORS, SOCKETS,CABLE ASSEMBLIES OR INTERCONNECTION SYSTEMS |
EIA SP 3408 | SURFACE MOUNT SOLDERABILITY TEST |
EIA SP 3410 | VIBRATION TEST PROCEDURE FOR ELECTRICAL CONNECTORS |
EIA SP 3411 | MECHANICAL SHOCK (SPECIFIED PULSE) TEST PROCEDURE FOR ELECTRICAL CONNECTORS |
EIA SP 3427 | HUMIDITY TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS |
EIA SP 3428 | DUST TEST FOR ELECTRICAL CONNECTORS AND SOCKETS |
EIA SP 3444 | DETAIL SPECIFICATION FOR BLIND-MATE, SCOOP PROOF, EVA AND ROBOTICALLY COMPATIBLE, SUBMINIATURE RECTANGULAR, LOW FORCE, |
EIA SP 3458 | BLANK DETAIL SPECIFICATION FOR DISCRETE CONTACTS OF CERTIFIED QUALITY |
EIA SP 3505 | SECTIONAL SPECIFICATION FOR ROTARY SWITCHES OF CERTIFIED QUALITY (LOW CURRENT CAPACITY - 2 AMPERES OR LESS) |
EIA SP 3514 | GUIDE OF SPACE GRADE REQUIREMENTS FOR ELECTRICAL CONNECTORS |
EIA SP 3542 | 1.27 MM PITCH, RIBBON CONTACT (LEAF SPRING) TRAPEZOIDAL SHAPED, SELF-LOCKING I/O CONNECTOR |
EIA SP 3549 | SECTIONAL SPECIFICATION FOR DIGITAL SWITCHES OF CERTIFIED QUALITY |
EIA SP 3550 | BLANK DETAIL SPECIFICATION FOR SPECIAL-USE DIGITAL SWITCHES OF CERTIFIED QUALITY |
EIA SP 3556 | SPECIFICATION FOR SMALL FORM FACTOR 1.8 INCH DISK DRIVES |
EIA SP 3557 | SPECIFICATION FOR SMALL FORM FACTOR 1.3 INCH DISK DRIVES |
EIA SP 3558 | SPECIFICATION FOR SMALL FORM FACTOR 1.8 INCH DISK DRIVES (15 MM HIGH) |
EIA SP 3559 | SPECIFICATION FOR SMALL FORM FACTOR POWER CONNECTOR PIN DIMENSIONS |
EIA SP 3562 | GENERIC SPECIFICATION FOR ELECTRONIC AND ELECTRICAL CONNECTORS OF CERTIFIED QUALITY (FOR FREQUENCIES ESSENTIALLY BELOW |
EIA SP 3586 | INSULATION RESISTANCE TEST PROCEDURE FOR ELECTRICAL CONNECTORS |
EIA SP 3622 | TEST METHOD FOR THE VISUAL INSPECTION OF QUARTZ CRYSTAL RESONATOR BLANKS |
EIA SP 3628 | MICROSECOND DISCONTINUITY TEST PROCEDURE FOR ELECTRICAL CONNECTORS, CONTACTS AND SOCKETS |
EIA SP 3640 | CRIMP CONTACT DEFORMATION TEST PROCEDURE FOR ELECTRICAL CONNECTORS |
EIA SP 3641 | SECTIONAL SPECIFICATION FOR BURN-IN SOCKETS USED WITH BALL GRID ARRAY DEVICES FOR USE IN ELECTRONIC EQUIPMENT |
EIA SP 3642 | BLANK DETAIL SPECIFICATION FOR BURN-IN SOCKETS USED WITH BALL GRID ARRAY DEVICES FOR USE IN ELECTRONIC EQUIPMENT |
EIA SP 3643 | DETAIL SPECIFICATION FOR BURN-IN SOCKETS USED WITH BALL GRID ARRAYDEVICES FOR USE IN ELECTRONIC EQUIPMENT |
EIA SP 3651 | DETAIL SPECIFICATION FOR TRAPEZOIDAL CONNECTORS WITH NON-REMOVABLERIBBON CABLE CONTACTS ON 1.27 MM PITCH DOUBLE ROW US |
EIA SP 3652 | DETAIL SPECIFICATION FOR TRAPEZOIDAL SHIELDED CONNECTOR 0.8 MM PITCH USED WITH VERY HIGH DENSITY CABLE INTERCONNECT (V |
EIA TEP 196 | CATHODE RAY TUBE X-RADIATION ROUND ROBIN PROCEDURES |
EIA TEP 197 | PREPARATION OF X-RADIATION CHARACTERISTIC CURVES FOR CATHODE RAY TUBES |
EIA TEP 29 | HARD GLASS BULB CRITERIA & BULB OUTLINES |
EIA TEP 41 | GUIDE FOR PULSE RATING LOW POWER VACUUM TUBES |
EIA TEP 42 | APPLICATION NOTES ON PULSE MAGNETRONS |
EIA TEP 62 | TYPICAL TEPAC PICTURE TUBE SCREEN DIMENSIONS |
EIA TEP 66 | MULTI ANGLE 2-PARAMETER SPECULAR GLOSS MEAS COLOR |
EIA TEP 68 | GLOSSARY OF REC QUALITY CONTROL RELIABILITY TERMS |
EIA TEP 72 | CONVERSION OF US TO METRIC DIMENSIONS FOR COLOR |
EIA TEP 82 | MEASUREMENTS OF RADIATION |
EIA TEP 92 | CATHODE RAY TUBES/GLOSSARY OF TERMS/DEFINITIONS |
EIA TEP 94 | CONSIDERATIONS USED IN X-RADIATION RATINGS OF MONO |
EIA TEP 94-1 | CONSIDERATIONS USED IN ESTABLISHING X-RADIATION- |
EIA TEP 94-2 | CONSIDERATIONS USED ESTABLISHING X-RADIATION RATIN |
EIA TEP 97 | MEASUREMENTS OF RADIATION |
EIA-153 | MOLDED & DIPPED MICA CAPACITORS (WIRE LEAD STYLE) |
EIA-155 | FIXED WIREWOUND POWER RESISTORS |
EIA-156 | BATTERY SOCKET PATTERNS |
EIA-161 | UNIT STANDARDS FOR CERAMIC BASED PRINTED CIRCUITS |
EIA-162 | TEST STANDARD FOR CERAMIC BASED PRINTED CIRCUITS |
EIA-164 | FIXED PAPER/POLYESTER FILM DIELECTRIC CAPACITORS |
EIA-165 | CERAMIC DIELECTRIC CAPICITORS, CLASSES 1 AND 2 |
EIA-167 | TYPE DESIGNATIONS FOR RECEIVER TYPE TUBE SOCKETS |
EIA-171 | HIGH VOLTAGE CERAMIC CAPACITORS CLASS 2 |
EIA-172 | FIXED COMPOSITION RESISTORS |
EIA-174 | AUDIO TRANSFORMERS FOR ELECTRONIC EQUIPMENT |
EIA-175 | AUDIO INDUCTORS |
EIA-176 | PULSE TRANSFORMERS FOR RADAR EQUIPMENT |
EIA-178 | SOLDERABILITY |
EIA-179 | CLASSIFICATION OF TUBE TESTERS |
EIA-180 | POWER TRANSFORMERS FOR ELECTRONIC EQUIPMENT |
EIA-181 | IRON CORE CHARGING INDUCTORS |
EIA-183 | OUTPUT TRANSFORMER FOR RADIO BROADCAST RECEIVERS |
EIA-185 | DIMENSIONAL AND ELECTRICAL CHARACTERISTICS DEFINING MINIATURE RECEIVER TYPE TUBE SOCKETS FOR PRINTED CIRCUITS |
EIA-186 | TEST METHODS FOR PASSIVE ELECTRONIC COMPONENT PART GENERAL INSTRUCTIONS AND INDEX OF TESTS |
EIA-186 SERIES | TEST METHODS FOR PASSIVE ELECTRONIC COMPONENT PARTS GENERAL INSTRUCTIONS AND INDEX OF TEST *** CONTAINS: EIA-186 |
EIA-186-1 | HUMIDITY (STEADY STATE) |
EIA-186-10 | EFFECT OF SOLDERING |
EIA-186-11 | THERMAL SHOCK IN AIR |
EIA-186-12 | HEAT-LIFE TEST |
ECA ENGINEERS RELAY HB | ENGINEERS RELAY HANDBOOK - (RSIA) |
ECA SP 4283 | ALUMINUM-ELECTROLYTIC CAPACITOR APPLICATION GUIDELINE |
ECA SP 4621 | STANDARD TEST METHOD FOR DESTRUCTIVE PHYSICAL ANALYSIS (DPA) OF CERAMIC MONOLITHIC CAPACITORS |
ECA SP 4903 | RESISTANCE TO SOLDERING HEAT TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS |
ECA SP 4904 | MOLDED TANTALUM CHIP CAPACITOR WITH POLYMER CATHODE |
ECA SP 4942 | GENERAL METHODS FOR POROSITY TESTING OF CONTACT FINISHES FOR ELECTRICAL CONNECTORS AND SOCKETS |
ECA SP 4945 | CONTACT RETENTION TEST PROCEDURE FOR ELECTRICAL CONNECTORS |
ECA SP 4970 | DETAIL SPECIFICATION FOR DUAL IN-LINE TWO-PIECE CONTACT SOCKET FOR USE IN ELECTRONIC EQUIPMENT |
ECA SP 4971 | DETAIL SPECIFICATION FOR 1.27 MM PITCH, 68 CIRCUIT MEMORY CARD INTERCONNECT SYSTEM |
ECA SP 4981 | TEMPERATURE RISE VERSUS CURRENT TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS |
ECA SP 4982-1 | GENERIC SPECIFICATION FOR SOCKETS FOR USE IN ELECTRONIC EQUIPMENT |
ECA SP 4984 | SURFACE MOUNT ALUMINUM ELECTROLYTIC CHIP CAPACITOR WITH POLYMER CATHODE |
ECA SP 4985 | ALUMINUM ELECTROLYTIC CHIP CAPACITOR WITH POLYMER CATHODE |
ECA SP 5037 | GLOSSARY OF ELECTRICAL CONNECTOR RELATED TERMS |
ECA SP 5038 | FLUID IMMERSION TEST PROCEDURE FOR ELECTRICAL CONNECTORS (TO BE PUBLISHED AS ANSI/EIA/ECA-364-1000.01A, TS-1000.01A) |
ECA SP 5050 | FLUID IMMERSION TEST PROCEDURE FOR ELECTRICAL CONNECTORS (TO BE PUBLISHED AS ANSI/EIA-364-10C) |
ECA SP 5051 | WITHSTANDING VOLTAGE TEST PROCEDURE FOR ELECTRICAL CONNECTORS, SOCKETS, AND COAXIAL CONTACTS (TO BE PUBLISHED AS ANSI |
ECA SP 5052 | RESISTORS, RECTANGULAR, SURFACE MOUNT, GENERAL PURPOSE |
ECA SP 5053 | RESISTORS, RECTANGULAR, SURFACE MOUNT, PRECISION |
ECA SP 5054 | COMPONENT TRAY FOR AUTOMATED HANDLING |
ECA SP 5055 | SPECIFICATION FOR PARALLEL 1.8 INCH DRIVE FORM FACTOR (78 MILLIMETER X 54 MILLIMETER) |
ECA SP 5056 | SPECIFICATION FOR DIMENSIONS AND CONNECTOR LOCATIONS OF SMALL FORMFACTOR 45 MILLIMETER (1.8 INCH) DISK DRIVE |
ECA SP 5058 | SPECIFICATION FOR SMALL FORM FACTOR 63.5 MM (2.5 INCH) DISK DRIVES |
ECA SP 5059 | SPECIFICATION FOR SMALL FORM FACTOR POWER CONNECTOR PIN DIMENSIONS |
ECA SP 5060 | DUST TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS (TO BE PUBLISHED AS ANSI/EIA-364-91A) |
ECA SP 5061 | RESTRICTED ENTRY TEST PROCEDURE FOR ELECTRICAL CONNECTORS |
ECA SP 5062 | COMBUSTION CHARACTERISTICS TEST PROCEDURE FOR ELECTRICAL CONNECTORHOUSING, CONNECTOR ASSEMBLIES AND SOCKETS |
ECA SP 5063 | CORROSIVITY OF PLASTIC TEST PROCEDURE FOR ELECTRICAL CONNECTOR, AND SOCKET HOUSINGS |
ECA SP 5064 | THERMAL CYCLING TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS |
ECA SP 5065 | RESISTANCE TO SOLVENTS TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS |
ECA SP 5071 | METALLIC COATING THICKNESS MEASUREMENT OF CONTACTS TEST PROCEDURE FOR ELECTRICAL CONNECTORS |
ECA SP 5083 | TEST PROCEDURES FOR ELECTRICAL CONNECTORS AND SOCKETS (TO BE PUBLISHED AS ANSI/EIA-364-5, 7, 8, 24, 25, 27, 37, 40, 44 |
ECA SP 5084 | DETERMINATION OF GAS-TIGHT CHARACTERISTICS TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND OR CONTACT SYSTEMS |
ECA SP 5085 | MICROSECOND DISCONTINUITY TEST PROCEDURE FOR ELECTRICAL CONNECTORS, CONTACT AND SOCKETS |
ECA SP 5086 | SPACE APPLICATION TEST PROCEDURE FOR ELECTRICAL CONNECTORS |
ECA SP 5089 | CURRENT CYCLING TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS |
ECA SP 5094 | VISUAL AND MECHANICAL INSPECTION MULTILAYER CERAMIC CHIP CAPACITORS |
ECA SP 5103 | FLUID IMMERSION TEST PROCEDURE FOR ELECTRICAL CONNECTORS |
ECA SP 5105 | METALLIC COATING THICKNESS MEASUREMENT OF CONTACTS TEST PROCEDURE FOR ELECTRICAL CONNECTORS |
ECA SP 5106 | CONTACT RESISTANCE TEST PROCEDURE FOR ELECTRICAL CONNECTORS |
ECA SP 5107 | TEST METHOLOGY FOR ASSESSING THE PERFORMANCE OF COMPLIANT CONTACT TERMINATIONS USED AS FREE STANDING CONTACTS OR IN EL |
ECA SP 5108 | TEST PROCEDURES FOR ELECTRICAL CONNECTORS AND SOCKETS (REAFFIRMATIONS FOR ANSI/EIA/ECA-364-2, 3, 9, 13, 14, 26, 28, 35 |
ECA SP 5109 | VISUAL AND DIMENSIONAL INSPECTION TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS |
ECA SP 5110 | CONTACT STRENGTH TEST PROCEDURE FOR ELECTRICAL CONNECTORS |
ECA SP 5111 | LOW TEMPERATURE TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS |
ECA SP 5112 | ELECTRICAL SOCKET SPECIFICATIONS (PROPOSED REAFFIRMATION OF ANSI/EIA-700AOAC, EIA-540AOOO, EIA-540AAOO, EIA-540AAAA, E |
ECA SP 5113 | LIGHTNING STRIKE TEST PROCEDURE FOR ELECTRICAL CONNECTORS |
ECA SP 5114 | ELECTRICAL RELAY SOCKET SPECIFICATIONS (PROPOSED REAFFIRMATION FORANSI/EIA-540COOOO, 540CAOOOO, 540CAAA, AND 540CAAB) |
ECA SP 5124 | RESISTANCE TO SOLDERING HEAT TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS |
ECA SP 5125 | VIBRATION TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS |
ECA SP 5126 | POLARIZING/CODING KEY OVERSTRESS TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS |
ECA SP 5127 | WIRE BENDING TEST PROCEDURE FOR INSULATION DISPLACEMENT CONTACTS (IDC) FOR ELECTRICAL CONNECTORS |
ECA SP 5134 | THERMAL SHOCK (TEMPERATURE CYCLING) TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS |
ECA SP 5136 | MATING AND UNMATING FORCE TEST PROCEDURE FOR ELECTRICAL CONNECTORS |
ECA SP 5142 | TEST PROCEDURES FOR ELECTRICAL CONNECTORS AND SOCKETS (TO BE PUBLISHED AS ANSI/EIA-364-01, 21, 22, 39, 43, 45, 53, 66, |
ECA SP 5143 | ENVIRONMENTAL TEST METHODOLOGY FOR ASSESSING THE PERFORMANCE OF ELECTRICAL CONNECTORS AND SOCKETS USED IN CONTROLLED E |
ECA SP 5148 | SOLDER WICKING (WAVE SOLDER TECHNIQUE) TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS |
ECA SP 5156 | TEMPERATURE LIFE WITH OR WITHOUT ELECTRICAL LOAD TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS |
ECA SP 5157 | MATING AND UNMATING FIRCE TEST PROCEDURE FOR ELECTRICAL CONNECTORSAND SOCKETS |
ECA SP 5158 | RESISTANCE TO SOLDERING HEAT TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS |
ECA SP 5160 | WITHSTANDING VOLTAGE TEST PROCEDURE FOR ELECTRICAL CONNECTORS, SOCKETS, AND COAXIAL CONTRACTS |
ECA SP 5161 | INSULATION RESISTANCE TEST PROCEDURE FOR ELECTRICAL CONNECTORS, SOCKETS, AND COAXIAL CONTRACTS |
ECA SP 5162 | CONTACT AXIAL CONCENTRICITY TEST PROCEDURE FOR ELECTRICAL CONNECTORS |
ECA SP 5163 | ALTITUDE - LOW TEMPERATURE TEST PROCEDURE FOR ELECTRICAL CONNECTORS |
ECA SP 5164 | TEST PROCEDURE FOR DETERMINING THE TOTAL IONIC CONTAMINATION OF ANELECTRICAL CONNECTOR OR SOCKET ASSEMBLY OR COMPONENT |
ECA SP 5166 | FLUID IMMERSION TEST PROCEDURE FOR ELECTRICAL CONNECTORS |
ECA SP 5167 | TEST PROCEDURES FOR ELECTRICAL CONNECTORS AND SOCKETS |
ECA SP 5168 | THERMAL SHOCK (TEMPERATURE CYCLING) TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS |
ECA SP 5169 | CABLE PULL-OUT TEST PROCEDURE FOR ELECTRICAL CONNECTORS ***TO BE PUBLISHED AS ANSI/EIA/ECA-364-38C*** |
ECA SP 5170 | CABLE FLEXING TEST PROCEDURE FOR ELECTRICAL CONNECTORS |
ECA SP 5171 | ELECTRICAL CONNECTOR/SOCKET TEST PROCEDURES INCLUDING ENVIRONMENTAL CLASSIFICATIONS |
ECA SP 5173 | 8MM THROUGH 200 MM EMBOSSED CARRIER TAPING AND 8MM &12MM PUNCHED CARRIER TAPING OF SURFACE MOUNT COMPONENTS FOR AUTOMA |
ECA SP 5174 | ENVIRONMENTAL TEST METHODOLOGY FOR VERIFYING THE CURRENT RATING OF FREE-STANDING POWER CONTACTS OR ELECTRICAL CONNECTO |
EIA CB 11 | GUIDELINES FOR THE SURFACE MOUNTING OF MULTILAYER CERAMIC CHIP CAPACITOR |
EIA CB 12 | GOLD PLATING STUDY TEST REPORT |
EIA CB 13 | X-RAY FLUORESCENCE FOR MEASURING PLATING THICKNESS |
EIA CB 14 | CONTACT LUBRICATION |
EIA CB 16 | INTEGRATED PASSIVE DEVICE (IPD) DEFINITIONS |
EIA CB 2 | CONTAMINATION OF PRINTED WIRING BOARDS |
EIA CB 3 | SPECIFICATIONS AND STANDARDS ASSOCIATED WITH SOLDERS AND SOLDERING |
EIA CB 4 | EFFECT OF THE WIRE DIAMETER ON WIREWOUND RESISTOR RELIABILITY |
EIA CB 5 | TEST PROCEDURE FOR SEMICONDUCTOR THERMAL DISSIPATING DEVICES |
EIA CB 5-1 | TEST PROCEDURE FOR SEMICONDUCTOR THERMAL DISSIPATING DEVICES |
EIA CB 6 | GUIDE FOR THE USE OF QUARTZ CRYTAL UNITS FOR FREQUENCY CONTROL |
EIA CB 7 | OCCULAR SAFETY ASPECTS OF LED'S IN FIBER OPTIC SYS |
EIA CB 8 | LIST OF APPROVAL AGENCIES, U.S. & OTHER COUNTRIES IMPACTING ELECTRONIC COMPONENTS AND EQUIPMENT |
EIA GEN 101 | COLOR CODING FOR NUMERICAL VALUE |
EIA GEN 104 | COLOR MARKING OF THERMOPLASTIC INSULATED HOOK-UP WIRE |
EIA IS 28 | FIXED TANTALUM CHIP CAPACITOR STYLE 1 PROTECTED- |
EIA IS 29 | FIXED TANTALUM CHIP CAPACITOR STYLE 1 PROTECTED- |
EIA IS 30 | RESISTORS, RECTANGULAR SURFACE MOUNT THICK FILM |
EIA IS 34 | LEADED SURFACE MOUNT RESISTOR NETWORKS FIXED FILM |
EIA IS 35 | TWO-PIN DUAL-IN-LINE CAPACITORS |
EIA IS 36 | CHIP CAPACITORS, MULTI-LAYER (CERAMIC DIELECTRIC) |
EIA IS 37 | MULTIPLE LAYER HIGH VOLTAGE CAPACITORS (RADIAL LEAD CHIP CAPACITORS) |
EIA IS 38 | RADIAL LEAD CAPACITORS (CONFORMALLY COATED) |
EIA IS 39 | CERAMIC DIELECTRIC AXIAL CAPACITORS (GLASS ENCAPSULATED) |
EIA IS 43 | LOCAL AREA NETWORK TWISTED PAIR DATA COMMUNICATIONS CABLE |
EIA IS 43 SERIES | CABLE FOR LAN TWISTED PAIR DATA COMMUNICATIONS-DETAIL |
EIA IS 43AA | CABLE LAN TWISTED PAIR DATA COMMUNICATION-DETAIL SPECIFICATION FOR TYPE 1, OUTDOOR CABLE |
EIA IS 43AB | CABLE FOR LAN TWISTED PAIR DATA COMMUNICATIONS-DETAIL SPECIFICATION FOR TYPE 1, NON-PLENUM CABLE |
EIA IS 43AC | CABLE LAN TWISTED PAIR DATA COMMUNICATIONS-DETAIL SPECIFICATION FOR TYPE 1, RISER CABLE |
EIA IS 43AD | CABLE FOR LAN TWISTED PAIR DATA COMMUNICATIONS-DETAIL SPECIFICATION FOR TYPE 1, PLENUM CABLE |
EIA IS 43AE | CABLE FOR LAN TWISTED PAIR DATA COMMUNICATIONS-DETAIL SPECIFICATION FOR TYPE 2, NON PLENUM CABLE |
EIA IS 43AF | CABLE FOR LAN TWISTED PAIR DATA COMMUNICATIONS-DETAIL SPECIFICATION FOR TYPE 2, PLENUM CABLE |
EIA IS 43AG | CABLE FOR LAN TWISTED PAIR DATA COMMUNICATIONS-DETAIL SPECIFICATION FOR TYPE 6, OFFICE CABLE |
EIA IS 43AH | CABLE FOR LAN TWISTED PAIR DATA COMMUNICATIONS-DETAIL SPECIFICATION FOR TYPE 8, UNDERCARPET CABLE |
EIA IS 43AJ | CABLE FOR LAN TWISTED PAIR DATA COMMUNICATIONS-DETAIL SPECIFICATION FOR TYPE 9, PLENUM CABLE |
EIA IS 46 | TEST PROCEDURE FOR RESISTANCE TO SOLDERING (VAPOR PHASE TECNIQUE) FOR SURFACE MOUNT DEVICES |
EIA IS 47 | CONTACT TERMINATION FINISH STANDARD FOR SURFACE MOUNT DEVICES |
EIA IS 48 | AXIAL LEAD FIXED RADIO FREQUENCY (RF) COILS |
EIA IS 49 | SOLDERABILITY TEST PROCEDURES |
EIA IS 50 | CONNECTORS, ELECTRICAL, FIREWALL (FLAME) TEST PROCEDURE |
EIA IS 535BAAE | DETAIL SPECIFICATION FOR LOW ESR MOLDED TANTALUM CHIP |
EIA IS 64 | 2 MILLIMETER, TWO-PART CONNECTORS FOR USE WITH PRINTED BOARDS AND BACKPLANES |
EIA IS 692 | CERAMIC CAPACITOR QUALIFICATION SPECIFICATION |
EIA IS 701 | PRODUCTION BALL GRID ARRAY (BGA) SOCKET TEST SPECIFICATION |
EIA IS 703 | GENERAL RESISTOR STRESS TEST QUALIFICATION SPECIFICATION |
EIA IS 717 | SURFACE MOUNT TANTALUM CAPACITOR QUALIFICATION SPECIFICATION |
EIA IS 722 | LOW VOLTAGE SUPPLEMENTAL FUSE QUALIFICATION SPECIFICATION |
EIA IS 749 | RECTIFIED MAINS APPLICATION EXPECTED WEAR-OUT LIFETIME TEST |
EIA IS 757 | VISUAL AND MECHANICAL INSPECTION FOR MOLDED SMT SOLID TANTALUM CAPACITORS |
EIA IS 760 | SUFRACE MOUNT WIREWOUND INDUCTOR QUALIFICATION SPECIFICATION |
EIA IS 772 | USER'S APPLICATION GUIDE TO FUSES |
EIA IS 84 | INTERIM DETAIL SPECIFICATION FOR 2.5 MM TWO PART CONNECTOR FOR USEIN ELECTRONIC EQUIPMENT |
EIA JEB 67 | MEASUREMENT OF X-RADIATION FROM RECEIVING TUBES |
EIA PDP 100 | REGISTERED & STANDARD MECHANICAL OUTLINES FOR ELECTRONIC PARTS ***SEE ALSO UPDATE*** ***NEW REVISION IS ON HOLD/STILL |
EIA PDP 100 RENEWAL | REGISTERED & STANDARD MECHANICAL OUTLINES, ELECTRONIC PART RENEWAL SERVICE **BEING REVISED*** |
EIA PQC 71 | RADIO FREQUENCY CABLES OF ASSESSED QUALITY |
EIA PRODUCT CODE 4 | COMPONENTS PARTS (PASSIVE PARTS) |
EIA PRODUCT CODE 6 | ELECTRONIC DISPLAY AND TUBES |
EIA REC 125 | PHONOGRAPH PICK-UPS |
EIA SP 1636 | STANDARD TEST METHOD FOR DESTRUCTIVE PHYSICAL ANALYSIS (DPA) OF CERAMIC MONOLITHIC CAPACITORS |
EIA SP 2077 | DETAIL SPECIFICATION FOR ROUND STYLE SOCKETS |
EIA SP 2143 | TRANSMISSION LINE REFLECTIONS OF CONNECTORS IN THE TIME DOMAIN |
EIA SP 2186 | DETAIL SPECIFICATION FOR SINGLE POLE, DOUBLE THROW, SURFACE MOUNT SUBMINIATURE SIZE TOGGLE SWITCHES |
EIA SP 2341 | BLANK DETAIL SPECIFICATION FOR ROUND STYLE SOCKETS |
EIA SP 2401 | LIGHTNING STRIKE TEST PROCEDURE FOR ELECTRICAL CONNECTORS |
EIA SP 2403 | DETAIL SPECIFICATION FOR DECOUPLING CAPACITOR DUAL-IN LINE PACKAGE SOCKETS FOR USE IN ELECTRONIC EQUIPMENT |
EIA SP 2412 | INSERT BOND STRENGTH TEST PROCEDURE FOR ELECTRICAL CONNECTORS |
EIA SP 2426 | LOW FREQUENCY SHIELDING EFFECTIVENESS |
EIA SP 2800 | SECTIONAL SPECIFICATION FOR FIXED METALLIZED ELECTRODE FILM DIELECTRIC AC CAPACITORS |
EIA SP 2804 | BLANK DETAIL SPECIFICATION FOR FIXED METALLIZED ELECTRODE FILM DIELECTRIC AC CAPACITORS |
EIA SP 2805 | DETAIL SPECIFICATION FOR FIXED POLYETHYLENE TEREPHTHALATE FILM DIELECTRIC D.C. CAPACITORS RADIAL LEADED |
EIA SP 2806 | DETAIL SPECIFICATION FOR FIXED METALLIZED POLYETHYLENE TEREPHTHALATE FILM DIELECTRIC D.C. CAPACITORS AXIAL LEADED |
EIA SP 2831 | SECTIONAL SPECIFICATION FOR CIRCULAR MULTICONTACT CONNECTORS OF ASSESSED QUALITY (FOR FREQUENCIES ESSENTIALLY BELOW 3 |
EIA SP 2907 | SHELL TO SHELL AND SHELL TO BULKHEAD RESISTANCE TEST PROCEDURE FOR ELECTRICAL CONNECTORS |
EIA SP 2917 | GENERAL TEST PROCEDURE FOR ASSESSING WEAR AND MECHANICAL DAMAGE TESTING OF CONTACT FINISHES FOR ELECTRICAL CONNECTORS |
EIA SP 2940 | SECTIONAL SPECIFICATION FOR PRINTED BOARD CONNECTORS OF CERTIFIED QUALITY (FOR FREQUENCIES ESSENTIALLY BELOW 2 MHZ) |
EIA SP 2942 | DETAIL SPECIFICATION FOR 1.27 MM PITCH, RIBBON CONTACT, TRAPEZOIDAL SHAPED, SHIELDED I/O CONNECTOR |
EIA SP 2945 | GLOSSARY OF ELECTRICAL CONNECTOR RELATED TERMS |
EIA SP 2958 | SECTIONAL SPECIFICATION FOR RECTANGULAR/TRAPEZOIDAL CONNECTORS OF CERTIFIED QUALITY |
EIA SP 2959 | BLANK DETAIL SPECIFICATION FOR RECTANGULAR/TRAPEZOIDAL CONNECTORS OF CERTIFIED QUALITY |
EIA SP 3047 | DETAIL SPECIFICATION FOR 1.27MM PITCH, 68 CIRCUIT MEMORY CARD INTERCONNECT SYSTEM |
EIA SP 3048 | DETAIL SPECIFICATION FOR 1.00 MM PITCH, 88 CIRCUIT DRAM MEMORY CARD INTERCONNECT SYSTEM |
EIA SP 3049 | DETAIL SPECIFICATION FOR MECHANICALLY ACTUATED (ZERO AND LOW INSERTION FORCE) SOCKETS FOR PIN GRID ARRAY DEVICES WITH |
EIA SP 3090 | DETAIL SPECIFICATION FOR ROTARY SWITCHES OF CERTIFIED QUALITY (LOW CURRENT RATING) 12 POSITIONS MAXIMUM |
EIA SP 3091 | DETAIL SPECIFICATION FOR ROTARY SWITCHES OF CERTIFIED QUALITY (LOW CURRENT RATING) 16 POSITIONS MAXIMUM |
EIA SP 3095 | REGISTERED SCREEN DIMENSIONS FOR COLOR PICTURE TUBES |
EIA SP 3116 | DETAIL SPECIFICATION FOR DUAL IN-LINE MEMORY MODULE SOCKETS (DIMM), 1.27 MM PITCH, VERTICAL MOUNT |
EIA SP 3117 | ELECTRICAL CONNECTOR /SOCKET TEST PROCEDURES INCLUDING ENVIRONMENTAL CLASSIFICATIONS |
EIA SP 3128 | POLARIZING/CODING KEY OVERSTRESS TEST PROCEDURE FOR ELECTRICAL CONNECTORS |
EIA SP 3137 | NANOSECOND EVENT DETECTION FOR ELECTRICAL CONNECTORS, CONTACTS AND SOCKETS |
EIA SP 3162 | DETAIL SPECIFICATION FOR SINGLE POLE, SINGLE THROW, SURFACE MOUNT PUSHBUTTON SWITCHES |
EIA SP 3179 | 2 MILLIMETER, TWO-PART CONNECTORS FOR USE WITH PRINTED BOARDS AND BACKPLANES |
EIA SP 3192 | RESIDUAL MAGNETISM FOR ELECTRICAL CONNECTORS |
EIA SP 3252 | TEST PROCEDURE FOR ELECTRICAL CONNECTORS FOR SPACE APLICATIONS |
EIA SP 3653 | WIRE BENDING TEST PROCEDURE FOR INSULATION DISPLACEMENT CONTACTS (IDC) FOR ELECTRICAL CONNECTORS |
EIA SP 3654 | REPEATED WIRE CONNECTION AND DISCONNECTION TEST PROCEDURE FOR INSULATION DISPLACEMENT CONTACTS (IDC) FOR ELECTRICAL CO |
EIA SP 3655 | TRANSVERSE EXTRACTION FORCE TEST PROCEDURE FOR INSULATION DISPLACEMENT CONTACTS (IDC) FOR ELECTRICAL CONNECTORS |
EIA SP 3659 | FULL MATING AND MATING STABILITY TEST PROCEDURE FOR CIRCULAR ELECTRICAL CONNECTORS |
EIA SP 3689 | AIR LEAKAGE TEST PROCEDURE FOR ELECTRICAL CONNECTORS |
EIA SP 3697 | DETAIL SPECIFICATION ON RELAY SOCKETS - 5 A FOR BALANCED ARMATURE RELAY |
EIA SP 3698 | DETAIL SPECIFICATION ON RELAY SOCKET - 10 A FOR BALANCED ARMATURE RELAY |
EIA SP 3699 | BLANK DETAIL SPECIFICATION ON RELAY SOCKETS |
EIA SP 3700 | SECTIONAL SPECIFICATION: SOCKETS FOR RELAYS FOR USE IN ELECTRONIC EQUIPMENT |
EIA SP 3702 | DETAIL SPECIFICATION FOR HIGH DENSITY BLADE CONNECTOR (396/556 PINCONTACT FAMILIES) |
EIA SP 3703 | DETAIL SPECIFICATION FOR HIGH DENSITY TUNING FORK CONTACTS AND COMPONENTS OF CERTIFIED QUALITY |
EIA SP 3712 | RESISTANCE TO SOLVENTS TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS |
EIA SP 3713 | PROBE DAMAGE TEST PROCEDURE FOR ELECTRICAL CONNECTORS |
EIA SP 3720 | DETAIL SPECIFICATION FOR PRODUCTION BALL GRID ARRAY (BGA) SOCKETS WITH 1.27MM (0.050 IN) SPACING USED IN ELECTRONIC EQ |
EIA SP 3732 | DIMENSIONAL CHARACTERISTICS DEFINING EDGE CLIPS FOR USE WITH HYBRID AND CHIP CARRIERS |
EIA SP 3733 | DIMENSIONAL, MECHANICAL, AND ELECTRICAL CHARACTERISTICS DEFINING RIGHT ANGLE, PC MOUNT MINIATURE TELEPHONE JACKS AND P |
EIA SP 3734 | GENERAL STANDARD FOR SOCKETS FOR USE WITH DUAL AND SINGLE IN-LINE ELECTRONIC PACKAGES AND OTHER ELECTRONIC COMPONENTS |
EIA SP 3735 | SOCKETS INDIVIDUAL LEAD TYPES (FOR ELECTRICAL AND ELECTRONIC COMPONENTS) |
EIA SP 3736 | APPLICATION GUIDE FOR IC SOCKETS |
EIA SP 3737 | SOLDER WICKING TEST PROCEDURE FOR SOCKETS, PLUG-IN ELECTRONIC COMPONENTS |
EIA SP 3738 | LEAD SOCKET PANELS FOR USE WITH INTEGRATED CIRCUITS |
EIA SP 3739 | DIMENSIONAL AND FUNCTIONAL CHARACTERISTICS DEFINING SOCKETS FOR LEADLESS TYPE A CHIP CARRIERS (.050 SPACING) |
EIA SP 3740 | DIMENSIONAL MECHANICAL AND ELECTRICAL CHARACTERISTICS DEFINING PHONE PLUGS AND JACKS |
EIA SP 3741 | SOCKETS, PLUG-IN ELECTRONIC COMPONENTS, ROUND STYLE |
EIA SP 3742 | DIMENSIONAL AND ELECTRICAL CHARACTERISTICS DEFINING RECEIVER TYPE SOCKETS (CRT SOCKET, .787 (20 MM) NECK DIAMETER, 7 C |
EIA SP 3743 | DIMENSIONAL AND ELECTRICAL CHARACTERISTICS DEFINING RECEIVER TYPE SOCKETS |
EIA SP 3744 | TYPE DESIGNATION FOR RECEIVER TYPE TUBE SOCKETS |
EIA SP 3745 | BATTERY SOCKET PATTERNS |
EIA SP 3752 | PROPOSED REVISION OF EIA-364-17A, TP-17A "TEMPERATURE LIFE WITH OR WITHOUT ELECTRICAL LOAD TEST PROCEDURE FOR ELECTRIC |
EIA SP 3763 | DUST (FINE SAND) TEST PROCEDURE FOR ELECTRICAL CONNECTORS |
EIA SP 3765 | REGISTERED SCREEN DIMENSIONS FOR MONOCHROME PICTURE TUBES |
EIA SP 3785 | NITRIC ACID VAPOR TEST, GOLD FINISH TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS |
EIA SP 3786 | PROPOSED REVISION OF EIA-364-70, TP-70 "TEMPERATURE RISE VERSUS CURRENT TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND S |
EIA SP 3800 | PROPOSED REVISION OF EIA-364-23A TP-23A "LOW LEVEL CONTACT RESISTANCE TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOC |
EIA SP 3801 | PLATED THROUGH HOLE INTEGRITY TEST PROCEDURE FOR ELECTRICAL CONNECTORS |
EIA SP 3811 | HOUSING PANEL RETENTION TEST PROCEDURE FOR ELECTRICAL CONNECTORS |
EIA SP 3812 | HOUSING LOCKING MECHANISM STRENGTH TEST PROCEDURE FOR ELECTRICAL CONNECTORS |
EIA SP 3813 | PROPOSED REVISION OF EIA-364-44, TP-44 "CORONA TEST PROCEDURE FOR ELECTRICAL CONNECTORS" |
EIA SP 3818 | FEED THROUGH RADIO INTERFACE CAPACITORS: PAPER, FILM AND PAPER/FILM DIELECTRIC |
EIA SP 3819 | FILM-PAPER, FILM DIELECTRIC CAPACITORS FOR 50/60 HZ VOLTAGE DOUBLER POWER SUPPLIES |
EIA SP 3820 | FILM DIELECTRIC CAPACITORS WITH METALLIZED PAPER ELECTRODES FOR ALTERNATING CURRENT APPLICATIONS |
EIA SP 3829 | USABLE SCREEN DIMENSIONS FOR MONOCHROME DISPLAY TUBES |
EIA SP 3858 | VIBRATION TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS |
EIA SP 3859 | PROPOSED REAFFIRMATION OF EIA-206 REVISION C "RECOMMENDED PRACTICE FOR PREPARATION OF BASING OR TERMINAL DIAGRAMS |
EIA SP 3860 | PROPOSED REAFFIRMATION OF EIA-212 REVISION A "NUMBERING OF ELECTRODES AND DESIGNATION OF UNITS IN ELECTRON TUBES |
EIA SP 3861 | PROPOSED REAFFIRMATION OF EIA-239 REVISION A "ELECTRICAL RATING SYSTEMS FOR ELECTRON TUBES" |
EIA SP 3862 | PROPOSED REAFFIRMATION OF EIA-202 REVISION A "RECOMMENDED PRACTICEFOR PREPARATION OF OUTLINE DRAWINGS OF ELECTRON TUBE |
EIA SP 3874 | DETAIL SPECIFICATION FOR 8-BYTE, 144 POSITION SMALL OUTLINE DUAL IN-LINE MEMORY MODULE (SO DIMM) SOCKETS, 0.8 MM PITCH |
EIA SP 3875 | EIA SPECIFICATION FOR SMALL FORM FACTOR 63.5MM (2.5IN) DISK DRIVES |
EIA SP 3876 | PROPOSED NEW SPECIFICATION "SPECIFICATION FOR SMALL FORM FACTOR 88.9 MM (3.5 IN) DISK DRIVES" |
EIA SP 3877 | PROPOSED NEW SPECIFICATION "SPECIFICATION FOR SMALL FORM FACTOR 133.35 MM (5.25 IN) DISK DRIVES |
EIA SP 3906 | SECTIONAL SPECIFICATION FOR SOCKETS FOR CHIP CARRIERS FOR USE IN ELECTRONIC EQUIPMENT |
EIA SP 3907 | BLANK DETAIL SPECIFICATION FOR CHIP CARRIER SOCKETS FOR LEADLESS TYPE A, B OR D CHIP CARRIERS FOR USE IN ELECTRONIC EQ |
