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AEC Q101

Revision D1, September 6, 2013

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FAILURE MECHANISM BASED STRESS TEST QUALIFICATION FOR DISCRETE SEMICONDUCTORS IN AUTOMOTIVE APPLICATIONS



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Product Details:

  • Revision: Revision D1, September 6, 2013
  • Published Date: September 6, 2013
  • Status: Active, Most Current
  • Document Language:
  • Published By: Automotive Electronics Council (AEC)
  • Page Count: 44
  • ANSI Approved: No
  • DoD Adopted: No

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