1971418

MIL MIL-STD-750-1A Change 2

Environmental Test Methods for Semiconductor Devices Part 1: Test Methods 1000 Through 1999

Amendment by Military Specifications and Standards , 08/12/2016

This document is an amendment. View the base document.

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Part 1 of this test method standard establishes uniform test methods for the basic environmental testing of semiconductor devices to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this test method standard, the term "devices" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts. This part of a multipart test method standard is intended to apply only to semiconductor devices.
 

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Published:
08/12/2016
Number of Pages:
177
File Size:
1 file , 1.5 MB
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