1775282

JEDEC JESD 353 (R2009)

THE MEASUREMENT OF TRANSISTOR NOISE FIGURE AT FREQUENCIES UP TO 20 kHz BY SINUSOIDAL SIGNAL-GENERATOR METHOD

standard by JEDEC Solid State Technology Association , 04/01/1968

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This noise measurement method applies to transistors whose noise has a Gaussian power distribution, to transistors whose noise has a flat (white) power distribution, and to transistors whose noise has a l/f (power inversely proportional to frequency) power distribution. Formerly known as RS-353 and/or EIA-353.
 

Product Details

Published:
04/01/1968
Number of Pages:
9
File Size:
1 file , 240 KB
Note:
This product is unavailable in Russia, Ukraine, Belarus