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ISO 17901-2:2015

Optics and photonics - Holography - Part 2: Methods for measurement of hologram recording characteristics

standard by International Organization for Standardization , 07/01/2015

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Full Description

ISO 17901-2:2015 specifies the terms and measurement method concerning exposure characteristics (exposure characteristic curve, exposure at half-maximum, R-value, amplitude of refractive index modulation) for the hologram recorded by double-beam interference. The materials of hologram to be measured are not restricted to any particular ones. ISO 17901-2:2015 does not intend to restrict manufacturing process.

 

Product Details

Published:
07/01/2015
Number of Pages:
28
File Size:
1 file , 530 KB
Same As:
BS ISO 17901-2:2015
Note:
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