1921156

SAE J2052_201607

Test Device Head Contact Duration Analysis (Stabilized: Jul 2016)

standard by SAE International , 07/12/2016

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About This Item

 

Full Description

This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.
 

Product Details

Published:
07/12/2016
File Size:
1 file , 170 KB
Note:
This product is unavailable in Ukraine, Russia, Belarus
 

Document History

  1. SAE J2052_201607

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    Test Device Head Contact Duration Analysis (Stabilized: Jul 2016)

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  2. SAE J2052_201101


    Test Device Head Contact Duration Analysis

    • Historical Version