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About This Item

 

Full Description

This part of IEC 60749 provides a steady-state temperature and humidity bias life test to evaluate the reliability of non-hermetic packaged semiconductor devices in humid environments.

This test method is considered destructive.
 

 

Document History

  1. IEC 60749-5 Ed. 3.0 b:2023

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    Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

    • Most Recent
  2. IEC 60749-5 Ed. 2.0 b:2017


    Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

    • Historical Version
  3. IEC 60749-5 Ed. 2.0 en:2017


    Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

    • Historical Version
  4. IEC 60749-5 Ed. 1.0 b:2003


    Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

    • Historical Version