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About This Item

 

Full Description

1.1 This calorimetric test method covers the determination of total hemispherical emittance of metal and graphite surfaces and coated metal surfaces up to approximately 1400°C. The upper-use temperature is limited only by the characteristics (for example, melting temperature, vapor pressure) of the specimen and the design limits of the test facility. This test method has been demonstrated for use up to 1400 °C. The lower-use temperature is limited by the temperature of the bell jar.

1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use. For specific hazard statements, see Section 7.

1.4 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

 

Document History

  1. ASTM C835-06(2020)

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    Standard Test Method for Total Hemispherical Emittance of Surfaces up to 1400 oC

    • Most Recent
  2. ASTM C835-06(2013)e1


    Standard Test Method for Total Hemispherical Emittance of Surfaces up to 1400 oC

    • Historical Version
  3. ASTM C835-06


    Standard Test Method for Total Hemispherical Emittance of Surfaces up to 1400 degrees ;C

    • Historical Version
  4. ASTM C835-01(2006)


    Standard Test Method for Total Hemispherical Emittance of Surfaces up to 1400 degrees C

    • Historical Version
  5. ASTM C835-01


    Standard Test Method for Total Hemispherical Emittance of Surfaces up to 1400 degrees C

    • Historical Version
  6. ASTM C835-00


    Standard Test Method for Total Hemispherical Emittance of Surfaces up to 1400 degrees C

    • Historical Version