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IEEE 1505.1-2019

IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505

standard by IEEE , 08/20/2019

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Full Description

Scope

The scope of this standard is the definition of a physical pin map utilizing the IEEE 1505(TM) receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace automatic test equipment (ATE) testing applications.

Purpose

The purpose of this standard is to permit the physical interoperability of IEEE 1505-compliant interface fixtures (also known as interface test adapters, interface devices, or interconnecting devices) on multiple ATE systems utilizing the IEEE 1505 RFI by providing a standardized physical pin map with related connector configuration and contact performance characteristics.

Abstract

Revision Standard - Active. An extension to the IEEE 1505TM receiver fixture interface (RFI) standard specification is provided in this standard. Particular emphasis is placed on defining within the IEEE 1505 RFI standard a more specific set of performance requirements that employ a common scalable: 1) pin map configuration; 2) specific connector modules; 3) respective contacts; 4) recommended switching implementation; and 5) legacy automatic test equipment (ATE) transitional devices. This is intentionally done to standardize the footprint and assure mechanical and electrical interoperability between past and future automatic test systems (ATS).
 

Product Details

Published:
08/20/2019
ISBN(s):
9781504459754, 9781504461993, 9781504462006, 9781504459761
Number of Pages:
157
File Size:
1 file , 9 MB
Redline File Size:
2 files , 28 MB
Product Code(s):
STD23757, STDRL23757, STDPD23757, STDPDRL23757
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This product is unavailable in Russia, Ukraine, Belarus
 

Document History

  1. IEEE 1505.1-2019

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    IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505

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  2. IEEE 1505.1-2008


    IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505

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