1949757 Preview

JEDEC JESD659C

FAILURE-MECHANISM-DRIVEN RELIABILITY MONITORING

standard by JEDEC Solid State Technology Association , 04/01/2017

View all product details

Most Recent

Track It

Language:
    • Available Formats
    • Options
    • Availability
    • Priced From ( in USD )
    • Printed Edition
    • Ships in 1-2 business days
    • $56.00
    • Add to Cart
    • Printed Edition + PDF
    • Immediate download
    • $76.00
    • Add to Cart

Customers Who Bought This Also Bought

 

About This Item

 

Full Description

This method establishes requirements for application of Statistical Reliability Monitoring 'SRM' technology to monitor and improve the reliability of electronic components and subassemblies. The standard also describes the condition under with a monitor may be replaced or eliminated. Formerly known as EIA-659, that superseded JESD29-A (July 1996). Became JESD625 after revision, September 1999.
 

Product Details

Published:
04/01/2017
Number of Pages:
16
File Size:
1 file , 170 KB
Note:
This product is unavailable in Russia, Ukraine, Belarus
 

Document History

  1. JEDEC JESD659C

    👀 currently
    viewing


    FAILURE-MECHANISM-DRIVEN RELIABILITY MONITORING

    • Most Recent

  2. JEDEC JESD659B


    FAILURE-MECHANISM-DRIVEN RELIABILITY MONITORING

    • Historical Version