Your search resulted in 2 documents for "JEDEC JESD 22-B112" amongst all current JEDEC documents.

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  1. MOST RECENT

    2577472

    JEDEC JESD22-B112C▹

    Package Warpage Measurement of Surface-Mount Integrated Circuits at Elevated Temperature

    standard by JEDEC Solid State Technology Association, 11/01/2023.

    Languages: English

    Historical Editions: JEDEC JESD22-B112A

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  2. MOST RECENT

    1779532

    JEDEC JESD22-B108B▹

    COPLANARITY TEST FOR SURFACE-MOUNT SEMICONDUCTOR DEVICES

    standard by JEDEC Solid State Technology Association, 09/01/2010.

    Languages: English

    Historical Editions: JEDEC JESD 22-B108A

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