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About This Item

 

Full Description

1.1''This test method covers the measurement of metallic coating thicknesses by examination of a cross section with a scanning electron microsope (SEM).

1.2''The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

1.3''This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use.

1.4''This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

 

Document History

  1. ASTM B748-90(2021)

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    Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope

    • Most Recent
  2. ASTM B748-90(2016)


    Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope

    • Historical Version
  3. ASTM B748-90(2010)


    Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope

    • Historical Version
  4. ASTM B748-90(2006)


    Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope

    • Historical Version
  5. ASTM B748-90(1997)


    Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope

    • Historical Version
  6. ASTM B748-90(2001)


    Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope

    • Historical Version