Hello. Sign In
Standards Store

Advanced X-Ray Characterization Techniques

2013 Edition, February 6, 2013

Complete Document



Detail Summary

Active, Most Current

EN
Additional Comments:
ISBN: 9783037855607
Format
Details
Price (USD)
PDF
Single User
$248.00
Print
Backordered
$310.00
Add to Cart

Product Details:

  • Revision: 2013 Edition, February 6, 2013
  • Published Date: February 6, 2013
  • Status: Active, Most Current
  • Document Language: English
  • Published By: Trans Tech Publications Inc. (TTP)
  • Page Count: 535
  • ANSI Approved: No
  • DoD Adopted: No

Description / Abstract:

X-ray applications and techniques are gaining importance and are moving to the forefront of science. A powerful tool with many advantages, X-ray applications and techniques present a route for rapid, hassle-free, non-destructive, safe and accurate analysis. This book contains a compilation of papers, all related to X-ray techniques, which are applied in various areas of science and technology, namely in research and industry. This publication aims to showcase the current diversity and versatility of X-ray related techniques. With contributors from all around the world, this publication of compiled papers will relate a host of X-ray related techniques with aims and the eventual findings, all of which are presented in a short and concise manner. It is believed that this book will be a good scientific literature which provides clear and important information on X-ray related ventures.