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AIIM MS24 1980 Edition, January 1, 1996
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Standard Test Target for Use in Microfilming Source Document Engineering Graphics on 35 mm Microfilm
Includes all amendments and changes through Reapproval Notice , September 26, 1996
Additional Comments: W/D NO S/S * SAME AS NMA MS24
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Purpose and scope

This standard addresses routine usage of test target elements for quality control testing. It does not address any precise evaluation of specifically defined characteristics (resolution, modulation transfer function, sensitometry, etc.) of an imaging system. The total target area described in this standard is based on the dedicated image area specified in ANSI/AIIM MS41.

The format of this standard allows the user to prepare a test target for an image area that is determined by the selection of a reduction ratio. This standard requires the notation of the reduction ratio used in creating the subsequent microfilm image of the test target.

The preferred locations for the optional 50-percent and 6-precent reflectance charts were derived from limitations of meter arm movement of some camera constructions. The location of these reflectance charts will not satisfy all current camera constructions. It is expected, however, that the user will use the optional chart placements necessary to accommodate the meter arm movement of the user's camera.

In the interest of economy, elements may be arranged and/or combined as a single test target for use at different reductions. If this option is exercised, the applicable dimensions that are based on the selected reduction ratio must be calculated accordingly. Overlap of elements is unacceptable

This standard specifies the minimum test target elements, their composition, and other criteria that addresses routine usage for testing. The test target elements are used by a 35 mm planetary microfilm camera when microfilming source document engineering graphics. Test targets for COM/CAD engineering graphics are not covered in this standard.