Purpose and scope
This standard addresses routine usage of test target elements for
quality control testing. It does not address any precise evaluation of
specifically defined characteristics (resolution, modulation transfer
function, sensitometry, etc.) of an imaging system. The total target
area described in this standard is based on the dedicated image area
specified in ANSI/AIIM MS41.
The format of this standard allows the user to prepare a test target for
an image area that is determined by the selection of a reduction ratio.
This standard requires the notation of the reduction ratio used in
creating the subsequent microfilm image of the test target.
The preferred locations for the optional 50-percent and 6-precent
reflectance charts were derived from limitations of meter arm movement
of some camera constructions. The location of these reflectance charts
will not satisfy all current camera constructions. It is expected,
however, that the user will use the optional chart placements necessary
to accommodate the meter arm movement of the user's camera.
In the interest of economy, elements may be arranged and/or combined as
a single test target for use at different reductions. If this option is
exercised, the applicable dimensions that are based on the selected
reduction ratio must be calculated accordingly. Overlap of elements is
This standard specifies the minimum test target elements, their
composition, and other criteria that addresses routine usage for
testing. The test target elements are used by a 35 mm planetary
microfilm camera when microfilming source document engineering graphics.
Test targets for COM/CAD engineering graphics are not covered in this