1997 Edition, January 10, 1997
Standard Test Method for Nanosecond Event Detection for Electrical Contacts and Connectors
Includes all amendments and changes through Reapproval Notice , 2014
Active, Most Current
BUNDLE AND SAVE:
Item is contained in these product bundles
Need it fast? Ask for rush delivery.
Most backordered items can be rushed in from the publisher in as little as 24 hours. Some rush fees may apply.
Contact your nearest IHS Markit Office to request rush delivery of any backordered item.
Description / Abstract:
This test method describes equipment and techniques for
detecting contact resistance transients yielding resistances
greater than a specified value and lasting for at least a specified