Hello. Sign In
Standards Store

ASTM E1078

2014 Edition, October 1, 2014

Complete Document

Standard Guide for Specimen Preparation and Mounting in Surface Analysis

View Abstract
Product Details
Document History

Detail Summary

Active, Most Current

Price (USD)
Single User
In Stock
PDF + Print
In Stock
$78.20 You save 15%
Add to Cart

People Also Bought These:

ASME B1.20.1

Product Details:

  • Revision: 2014 Edition, October 1, 2014
  • Published Date: October 1, 2014
  • Status: Active, Most Current
  • Document Language: English
  • Published By: ASTM International (ASTM)
  • Page Count: 10
  • ANSI Approved: No
  • DoD Adopted: No

Description / Abstract:

This guide covers specimen preparation and mounting prior to, during, and following surface analysis and applies to the following surface analysis disciplines:

Auger electron spectroscopy (AES),

X-ray photoelectron spectroscopy (XPS and ESCA), and

Secondary ion mass spectrometry (SIMS).

Although primarily written for AES, XPS, and SIMS, these methods will also apply to many surface sensitive analysis methods, such as ion scattering spectrometry, low energy electron diffraction, and electron energy loss spectroscopy, where specimen handling can influence surface sensitive measurements.

The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.