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ASTM E1078

2014 Edition, October 1, 2014

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Standard Guide for Specimen Preparation and Mounting in Surface Analysis



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Product Details:

  • Revision: 2014 Edition, October 1, 2014
  • Published Date: October 1, 2014
  • Status: Active, Most Current
  • Document Language: English
  • Published By: ASTM International (ASTM)
  • Page Count: 10
  • ANSI Approved: No
  • DoD Adopted: No

Description / Abstract:

This guide covers specimen preparation and mounting prior to, during, and following surface analysis and applies to the following surface analysis disciplines:

Auger electron spectroscopy (AES),

X-ray photoelectron spectroscopy (XPS and ESCA), and

Secondary ion mass spectrometry (SIMS).

Although primarily written for AES, XPS, and SIMS, these methods will also apply to many surface sensitive analysis methods, such as ion scattering spectrometry, low energy electron diffraction, and electron energy loss spectroscopy, where specimen handling can influence surface sensitive measurements.

The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.