Hello. Sign In
Standards Store

ASTM E1438

2011 Edition, November 1, 2011

Complete Document

Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS



View Abstract
Product Details
Document History

Detail Summary

Active, Most Current

EN
Format
Details
Price (USD)
PDF
Single User
$41.00
Print
In Stock
$41.00
PDF + Print
In Stock
$69.70 You save 15%
Add to Cart

Product Details:

  • Revision: 2011 Edition, November 1, 2011
  • Published Date: November 1, 2011
  • Status: Active, Most Current
  • Document Language: English
  • Published By: ASTM International (ASTM)
  • Page Count: 3
  • ANSI Approved: No
  • DoD Adopted: No

Description / Abstract:

This guide provides the SIMS analyst with a method for determining the width of interfaces from SIMS sputtering data obtained from analyses of layered specimens. This guide does not apply to data obtained from analyses of specimens with thin markers or specimens without interfaces such as ionimplanted specimens.

This guide does not describe methods for the optimization of interface width or the optimization of depth resolution.

This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.