1.1 Procedures are given for the correction of line overlap
interferences encountered in the analysis of metallic and nonmetallic
specimens in wavelength dispersive X-ray spectrometry.
1.2 Spectral interference occurs when a line of another element
appears at or close to the same wavelength as the analyte line. The
interfering line or lines may be from the same spectral order as the
analyte line or may be from another spectral order. Line overlap
interferences from higher order lines are usually removed when
pulse-height discrimination is used.
1.3 The procedures given in this practice are applicable to making
corrections for interferences arising from concomitants in the sample.
Interfering lines from the X-ray tube and associated instrumental
components are usually specific to the system and the procedure for
dealing with these may be found elsewhere. This is treated by E. P.
1.4 This practice is not generally applicable to simultaneous X-ray
spectrometers if it is not possible to measure a line of the
interfering element. Correction is possible, however, if the
concentration of the interfering element is known and can be entered
into the analytical program.
1.5 This standard does not purport to address all of the safety
concerns, if any, associated with its use. It is the responsibility of
the user of this standard to establish appropriate safety and health
practices and determine the applicability of regulatory limitations
prior to use.