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ASTM E1829

2014 Edition, October 1, 2014

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Standard Guide for Handling Specimens Prior to Surface Analysis



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Product Details:

  • Revision: 2014 Edition, October 1, 2014
  • Published Date: October 1, 2014
  • Status: Active, Most Current
  • Document Language: English
  • Published By: ASTM International (ASTM)
  • Page Count: 5
  • ANSI Approved: No
  • DoD Adopted: No

Description / Abstract:

This guide covers specimen handling and preparation prior to surface analysis and applies to the following surface analysis disciplines: 

Auger electron spectroscopy (AES), 

X-ray photoelectron spectroscopy (XPS or ESCA), and 

Secondary ion mass spectrometry (SIMS). 

Although primarily written for AES, XPS, and SIMS, these methods may also apply to many surface-sensitive analysis methods, such as ion scattering spectrometry, lowenergy electron diffraction, and electron energy loss spectroscopy, where specimen handling can influence surfacesensitive measurements. 

This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.