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ASTM E766

2014 Edition, January 1, 2014

Complete Document

Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope

Includes all amendments and changes through Editorial Change 1, May 2016


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Product Details:

  • Revision: 2014 Edition, January 1, 2014
  • Published Date: May 2016
  • Status: Active, Most Current
  • Document Language: English
  • Published By: ASTM International (ASTM)
  • Page Count: 6
  • ANSI Approved: No
  • DoD Adopted: No

Description / Abstract:

This practice covers general procedures necessary for the calibration of magnification of scanning electron microscopes. The relationship between true magnification and indicated magnification is a complicated function of operating conditions.2 Therefore, this practice must be applied to each set of standard operating conditions to be used.

The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.