Hello. Sign In
Standards Store




ASTM E983

2010 Edition, November 1, 2010

Complete Document

Standard Guide for Minimizing Unwanted Electron Beam Effects in Auger Electron Spectroscopy



View Abstract
Product Details
Document History

Detail Summary

Active, Most Current

EN
Format
Details
Price (USD)
PDF
Single User
$42.00
Print
In Stock
$42.00
PDF + Print
In Stock
$71.40 You save 15%
Add to Cart

Product Details:

  • Revision: 2010 Edition, November 1, 2010
  • Published Date: November 1, 2010
  • Status: Active, Most Current
  • Document Language: English
  • Published By: ASTM International (ASTM)
  • Page Count: 4
  • ANSI Approved: No
  • DoD Adopted: No

Description / Abstract:

This guide outlines the origins and manifestations of unwanted electron beam effects in Auger electron spectroscopy (AES).

Some general guidelines are provided concerning the electron beam parameters which are most likely to produce these effects and suggestions are offered on how to minimize them.

General classes of materials are identified which are most likely to exhibit unwanted electron beam effects. In addition, a tabulation of some specific materials which have been observed to undergo electron damage effects is provided.

A simple method is outlined for establishing the existence and extent of these effects during routine AES analysis.

The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.