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ASTM F1032

1991 Edition, February 22, 1991

Complete Document

STANDARD GUIDE FOR MEASURING TIME-DEPENDENT TOTAL-DOSE EFFECTS IN SEMICONDUCTOR DEVICES EXPOSED TO PULSED IONIZING RADIATION



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Product Details:

  • Revision: 1991 Edition, February 22, 1991
  • Published Date: February 22, 1991
  • Status: Not Active, See comments below
  • Document Language: English
  • Published By: ASTM International (ASTM)
  • Page Count: 3
  • ANSI Approved: No
  • DoD Adopted: No

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