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ASTM F77

1969 Edition, 1969

Complete Document

Standard Test Method for Apparent Density of Ceramics for Electron Device and Semiconductor Application

Includes all amendments and changes through Reapproval Notice , 1996


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W/D NO S/S
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Product Details:

  • Revision: 1969 Edition, 1969
  • Published Date: January 1996
  • Status: Not Active, See comments below
  • Document Language: English
  • Published By: ASTM International (ASTM)
  • Page Count: 3
  • ANSI Approved: No
  • DoD Adopted: No

Description / Abstract:



1. Scope

1.1 This test method covers the determination of the apparent density of ceramic parts, used in electron device and semiconductor applications, with a maximum dimension of 25 mm (1 in.) and having zero or discontinuous porosity.

1.2 The values stated in SI units are to be regarded as the standard. The values in parentheses are for information only.

1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.