Hello. Sign In
Standards Store




ASTM F947

85th Edition, July 26, 1985

Complete Document

Standard Test Method for Determining Low-Level X-Radiation Sensitivity of Photographic Films

Includes all amendments and changes through Reapproval Notice , 1996


View Abstract
Product Details
Document History

Detail Summary

Not Active, See comments below

EN
Additional Comments:
W/D NO S/S
Format
Details
Price (USD)
PDF
Single User
$58.00
Print
In Stock
$58.00
PDF + Print
In Stock
$98.60 You save 15%
Add to Cart

Product Details:

  • Revision: 85th Edition, July 26, 1985
  • Published Date: January 1996
  • Status: Not Active, See comments below
  • Document Language: English
  • Published By: ASTM International (ASTM)
  • Page Count: 3
  • ANSI Approved: No
  • DoD Adopted: No

Description / Abstract:

1. Scope

1.1 This test method determines the maximum x-ray sensitivity coefficient (slope of diffuse visual density versus x-ray exposure) of film/processing combinations for low quantities of x-ray exposure to silver halide photographic film. This coefficient can be used to assess the relative susceptibility of films to damage from x-ray exposure, such as that encountered in airport and similar security screening systems.

1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.