Hello. Sign In
Standards Store

BS 6493-3

1986 Edition, January 31, 1986

Complete Document

Semiconductor devices - Part 3: Mechanical and climatic test methods

Includes all amendments and changes through Amendment 2, February 15, 1994


View Abstract
Product Details
Document History

Detail Summary

Superseded By: BS EN 60749

EN
Additional Comments:
SAME AS IEC 60749 * W/D S/S BY BS EN 60749
Format
Details
Price (USD)
Secure PDF
Single User
$228.00
Print
In Stock
$228.00
Add to Cart

Product Details:

  • Revision: 1986 Edition, January 31, 1986
  • Published Date: February 15, 1994
  • Status: Superseded By:
  • Superseded By: BS EN 60749
  • Document Language: English
  • Published By: British Standards Institution (BSI)
  • Page Count: 42
  • ANSI Approved: No
  • DoD Adopted: No

Description / Abstract:

Special requirements for test methods additional to IEC 60068, and certain specific and complete test methods.