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BS CECC 50000

87th Edition, October 30, 1987

Complete Document

Harmonized system of quality assessment for electronic components - Generic specification: Discrete semiconductor devices

Includes all amendments and changes through Amendment 3, October 15, 1992


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SEE LEVEL 5 FOR SUPPLEMENT:1983
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Product Details:

  • Revision: 87th Edition, October 30, 1987
  • Published Date: October 15, 1992
  • Status: Active, Most Current
  • Document Language: English
  • Published By: British Standards Institution (BSI)
  • Page Count: 96
  • ANSI Approved: No
  • DoD Adopted: No

Description / Abstract:

Applies to diodes, transistors, rectifier diodes and thyristors. Specifies quality assessment and test and measurement conditions. Appendices on structural similarity, inspection requirements, tests and screening.