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BS QC 750100

86th Edition, December 31, 1986

Complete Document

Harmonized system of quality assessment for electronic components - Discrete semiconductor devices - Sectional specification

Includes all amendments and changes through Amendment 2, January 31, 2010


Detail Summary

Active, Most Current

EN
Additional Comments:
SAME AS IEC 60747-11
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Product Details:

  • Revision: 86th Edition, December 31, 1986
  • Published Date: January 31, 2010
  • Status: Active, Most Current
  • Document Language: English
  • Published By: British Standards Institution (BSI)
  • Page Count: 22
  • ANSI Approved: No
  • DoD Adopted: No

Description / Abstract:

Procedures to be followed with discrete semiconductor devices (excluding optoelectronic devices), the possible group conditions for structurally similar devices, the requirements for quality conformance inspection and the various steps for screening. Also preferred values of voltages and currents, identification of terminals.