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BS EN 60749-40:2011

Semiconductor devices. Mechanical and climatic test methods-Board level drop test method using a strain gauge

standard by British-Adopted European Standard , 09/30/2011

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About This Item

 

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Cross References:
IEC 60749-37
EN 60749-37


All current amendments available at time of purchase are included with the purchase of this document.
 

Product Details

Published:
09/30/2011
ISBN(s):
9780580646294
Number of Pages:
26
File Size:
1 file , 1.6 MB
Product Code(s):
30190357, 30190357, 30190357
Note:
This product is unavailable in Ukraine, Russia, Belarus
 

Document History

  1. BS EN 60749-40:2011

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    Semiconductor devices. Mechanical and climatic test methods-Board level drop test method using a strain gauge

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  2. BS 09/30190356 DC


    BS EN 60749-40. Semiconductor devices. Mechanical and climatic test methods. Part 40. Board level drop test method using a strain gauge

    • Historical Version