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    1721604

    BS EN 62417:2010

    Semiconductor devices. Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)

    standard by British-Adopted European Standard, 06/30/2010.

    Languages: English

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  2. BS 08/30177346 DC

    BS EN 62417. Mobile ion tests. Bias temperature stress (BTS). Triangular voltage sweep (TVS)

    standard by BSI Group, 01/31/2008.

    Languages:

  3. BS 07/30163752 DC

    BS EN 62417. Mobile ion tests. Bias temperature stress (BTS). Triangular voltage sweep (TVS)

    standard by BSI Group, 03/14/2007.

    Languages: