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Cross References:
ISO 5725-6
ISO 14594
ISO 16592:2006
ISO/IEC 17025:2005
ISO 17470
ISO 22489
ISO 23833


All current amendments available at time of purchase are included with the purchase of this document.
 

Document History

  1. BS ISO 11938:2012

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    Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy

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  2. BS 10/30185165 DC


    BS ISO 11938. Microbeam analysis. Electron probe microanalysis. Methods of elemental area analysis using wavelength-dispersive spectroscopy

    • Historical Version