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Characterization of Materials

2002 Edition, January 1, 2002

Complete Document

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Active, Most Current

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ISBN: 9780471266969
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Product Details:

  • Revision: 2002 Edition, January 1, 2002
  • Published Date: January 2002
  • Status: Active, Most Current
  • Document Language: English
  • Published By: John Wiley and Sons (WILEY)
  • Page Count: 0
  • ANSI Approved: No
  • DoD Adopted: No

Description / Abstract:

Characterization of Materials (formerly Methods in Materials Research) provides comprehensive up-to-date coverage of materials characterization techniques including computational and theoretical methods as well as crystallography, mechanical testing, thermal analysis, optical imaging and spectroscopy, and more. Editor-in-Chief, Elton Kaufmann, Ph.D. is Associate Director of the Strategic Planning Group at the Argonne National Laboratory and has published approximately 100 technical papers in refereed journals and books. Dr. Kaufmann has assembled leading experts from academia, government, and industry to provide: A comprehensive up-to-date collection of methods used in the characterization of materials Articles on various methods from standard to cutting edge Periodic online updates to keep pace with latest developments A user-friendly format that is easy and simple to search and navigate Characterization of Materials is a collection of characterization methods that is widely applicable in the wide and diverse field of materials research irrespective of discipline or ultimate application and with which researchers, engineers, and educators must have familiarity. Methods covered include: General Vacuum Techniques X-Ray Powder Diffraction High Strain Rate Testing Deep Level Transient Spectroscopy Cyclic Voltammetry Extended X-Ray Absorption Fine Structure Low Energy Electron Diffraction Thermogravimetric Analysis Magnetometry Transmission Electron Microscopy Ultraviolet Photoelectron Spectroscopy This reference work is also available as a convenient online edition. For information regarding the online edition, please visit: www.mrw.interscience.wiley.com/com