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DIN 50438-1

1995 Edition, July 1995

Complete Document

DETERMINATION OF INTERSTITIAL OXYGEN CONTENT OF SILICON INTENDED FOR USE IN SEMICONDUCTOR TECHNOLOGY BY INFRARED ABSORPTION SPECTROSCOPY



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Product Details:

  • Revision: 1995 Edition, July 1995
  • Published Date: July 1995
  • Status: Not Active, See comments below
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  • Published By: Deutsches Institut fur Normung E.V. (DIN)
  • Page Count: 13
  • ANSI Approved: No
  • DoD Adopted: No

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