EIA-311 Revision A, November 1, 1981
Transistor Noise Figure and Effective Input Noise Temperature at MF, HF and VHF, Measurement of
Includes all amendments and changes through Reaffirmation Notice , April 1999
Additional Comments: W/D S/S BY JEDEC JESD 311
Published By:JEDEC Solid State Technology Association (JEDEC)
This standard describes a test method for measurement of transistor noise figure and effective input noise temperature at MF, HF, and VHF. This standard also adds the necessary information to make 'effective input noise temperature measurements'. This method is a revision of EIA-311 and incorporates material previously found in EIA-283. Formerly known as RS-311A and/or EIA-311-A.