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EIA-311

Revision A, November 1, 1981

Complete Document

Transistor Noise Figure and Effective Input Noise Temperature at MF, HF and VHF, Measurement of

Includes all amendments and changes through Reaffirmation Notice , April 1999


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Superseded By: JEDEC JESD 311

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W/D S/S BY JEDEC JESD 311
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Description / Abstract:

This standard describes a test method for measurement of transistor noise figure and effective input noise temperature at MF, HF, and VHF. This standard also adds the necessary information to make 'effective input noise temperature measurements'. This method is a revision of EIA-311 and incorporates material previously found in EIA-283. Formerly known as RS-311A and/or EIA-311-A.