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EIA-318

Revision B, July 1996

Complete Document

Measurement of Reverse Recovery Time for Semiconductor Signal Diodes

Includes all amendments and changes through Reaffirmation Notice , April 1999


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Description / Abstract:

This standard describes the measurement of signal diodes (IF <=500mA dc) reverse recovery times of less than 300 ns duration. It may, however, also be used for the measurement of longer recovery times. This standard is also intended to establish a method which to characterize the test fixture used for this measurement.