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EIA-323

66th Edition, March 1, 1966

Complete Document

Air-Convection-Cooled Life Test Environment for Lead-Mounted Semiconductor Devices

Includes all amendments and changes through Reaffirmation Notice , November 2002


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Description / Abstract:

This standard is applicable to life testing of lead-mounted semiconductor devices intended for applications in a natural air-cooled environment where most of the power dissipation is obtained by convection and radiation losses from the body to the device.