1779517

JEDEC EIA 323 (R2002)

AIR-CONVECTION-COOLED, LIFE TEST ENVIRONMENT FOR LEAD-MOUNTED SEMICONDUCTOR DEVICES

standard by JEDEC Solid State Technology Association , 03/01/1966

View all product details

Most Recent

Track It

Language:
    • Available Formats
    • Options
    • Availability
    • Priced From ( in USD )
    • Printed Edition
    • Ships in 1-2 business days
    • $51.00
    • Add to Cart
    • Printed Edition + PDF
    • Immediate download
    • $69.00
    • Add to Cart

Customers Who Bought This Also Bought

 

About This Item

 

Full Description

This standard is applicable to life testing of lead-mounted semiconductor devices intended for applications in a natural air-cooled environment where most of the power dissipation is obtained by convection and radiation losses from the body to the device.
 

Product Details

Published:
03/01/1966
Number of Pages:
9
File Size:
1 file , 300 KB
Note:
This product is unavailable in Russia, Ukraine, Belarus