IEC 60748-11-1 1st Edition, April 1, 1992
Semiconductor Devices Integrated Circuits Part 11: Section 1: Internal Visual Examination for Semiconductor Integrated Circuits Excluding Hybrid Circuits
Additional Comments: BILINGUAL
Published By:International Electrotechnical Commission (IEC)
Scope and object
The purpose of these tests is to check the internal materials, construction and workmanship of integrated circuits for compliance with the requirements of the applicable specif ication.
These tests will normally be used prior to capping or encapsulation on a 100 % inspection basis to detect and eliminate devices with internal defects that could lead to device failure in normal application. They may also be employed on a sampling basis prior to capping to determine the effectiveness of the manufacturer's quality control and handling procedures for semiconductor devices.