Language:
    • Available Formats
    • Options
    • Availability
    • Priced From ( in USD )
    • Printed Edition
    • Ships in 1-2 business days
    • $367.00
    • Add to Cart

Customers Who Bought This Also Bought

 

About This Item

 

Full Description

IEC 61164:2004 gives models and numerical methods for reliability growth assessments based on failure data, which were generated in a reliability improvement programme. These procedures deal with growth, estimation, confidence intervals for product reliability and goodness-of-fit tests. The main changes with respect to the previous edition are:
- addition of two statistical models for reliability growth planning and tracking in the product design phase;
- statistical methods for the reliability growth programme in the design phase of IEC 61014;
- addition of the discrete reliability growth model for the test phase;
- addition of the fixed number of faults model for the test phase, clarification of the symbols used for various models;
- addition of real lif examples for most of the statistical models;
- numerical correction of tables in the reliability growth test example. This standard should be used in conjunction with IEC 61014.
 

Document History

  1. IEC 61164 Ed. 2.0 b:2004

    👀currently
    viewing


    Reliability growth - Statistical test and estimation methods

    • Most Recent
  2. IEC 61164 Ed. 2.0 en:2004


    Reliability growth - Statistical test and estimation methods

    • Historical Version