Hello. Sign In
Standards Store

Look Inside

IEC 61829

2nd Edition, October 2015

Complete Document

Photovoltaic (PV) array – On-site measurement of current-voltage characteristics

View Abstract
Product Details
Document History

Detail Summary

Active, Most Current

Additional Comments:
Price (USD)
Single User
In Stock
Add to Cart

People Also Bought These:

ASME B30.26
ICEA S-97-682
ISO 19011

Product Details:

Description / Abstract:

This International Standard specifies procedures for on-site measurement of flat-plate photovoltaic (PV) array characteristics, the accompanying meteorological conditions, and use of these for translating to standard test conditions (STC) or other selected conditions. Measurements of PV array current-voltage (I-V) characteristics under actual on-site conditions and their translation to reference test conditions (RTC) can provide:

• data for power rating or capacity testing;

• verification of installed array power performance relative to design specifications;

• detection of possible differences between on-site module characteristics and laboratory or factory measurements;

• detection of possible performance degradation of modules and arrays with respect to onsite initial data;

• detection of possible module or array failures or poor performance.

For a particular module, on-site measurements translated to STC can be directly compared with results previously obtained in a laboratory or factory for that module. Corrections for differences in the spectral or spatial response of the reference devices may need to be assessed as specified in IEC 60904.

On-site array measurements are affected by diode, cable, and mismatch losses, soiling and shading, degradation due to aging, and other uncontrolled effects. Therefore, they are not expected to be equal to the product of the number of modules and the respective module data.

If a PV array is formed with sub-arrays of different tilt, orientation, technology, or electrical configuration, the procedure specified in this International Standard is applied to each unique PV sub-array of interest.