2010 Edition, December 9, 2010
A Mixed-Signal Test Bus
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Description / Abstract:
This standard defines a mixed-signal test bus architecture that
provides the means of control and access to both analog and digital
test signals such that the testability structure for digital
circuits described in IEEE Std 1149.1-2001 has been extended
effectively to provide similar facilities for mixed-signal
circuits. In addition to testing of interconnections in the
conventional sense of IEEE Std 1149.1-2001, the mixed-signal test
bus defined by this standard also provides the means for parametric
testing and, optionally, the means to access internal test
structures. The standard does not mandate implementation details of
the test circuitry, although examples of conformant implementations
are given for illustration. Further, the standard develops
extensions to Boundary-Scan Description Language (BSDL) as a means
of describing key aspects of the implementation of this standard
within a particular component. At present, the extensions to BSDL
defined by this standard specifically omit the description of any
and all analog parameters defined by the standard.