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IEEE 592 2007 Edition, December 5, 2007
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Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Connectors
Additional Comments: ANSI
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This standard covers design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.