Hello. Sign In
Standards Store
Look Inside

IEEE C37.26

2014 Edition, August 21, 2014

Complete Document

Guide for Methods of Power-Factor Measurement for Low-Voltage (1000 V AC or lower) Inductive Test Circuits



View Abstract
Product Details
Document History

Detail Summary

Active, Most Current

EN
Format
Details
Price (USD)
PDF
Single User
$49.00
Print
In Stock
$61.00
Add to Cart

People Also Bought These:

ANSI Z136.1
ANSI/ISEA Z358.1
ASTM MNL36
AISC 325

Referenced Items:

IEEE C37.100

Product Details:


Description / Abstract:

This guide describes three methods used in the measurement of the power factor of inductive low-voltage (1000 V and lower) test circuits. These methods may be used at any frequency; however, the values in the tables are specifically for 60-Hz test circuits. These methods are as follows:

a) Ratio method

b) DC decrement method

c) Phase relationship method

Table 1 lists the preferred methods to be used for different levels of test currents and for different levels of power factor. While this guide is primarily intended for use on low-voltage test circuits, the methods discussed are also usable at higher voltages.

Purpose

The purpose of this guide is to recommend methods of measuring the power factor for inductive test circuits, so that the preferred method giving the greatest accuracy is recommended for any particular circuit.