1877339

ISO 15625:2014

Silk - Electronic test method for defects and evenness of raw silk

standard by International Organization for Standardization , 04/15/2014

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Full Description

ISO 15625:2014 specifies a test method for defects and evenness of raw silk by capacitive and optical electronic testers.

It is applicable to raw silk with the yarn size between 13,3 dtex and 76,7 dtex or 12 denier and 69 denier, whether in skein or on cone, soaked or unsoaked.

 

Product Details

Published:
04/15/2014
Number of Pages:
22
File Size:
1 file , 590 KB
Same As:
BS ISO 15625:2014
Note:
This product is unavailable in Ukraine, Russia, Belarus