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ISO 3274 2nd Edition, December 1, 1996
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Geometrical Products Specifications (GPS) - Surface Texture: Profile Method - Nominal Characteristics of Contact (Stylus) Instruments
Includes all amendments and changes through Technical Corrigendum 1, June 1, 1998
Additional Comments: ENGLISH
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This International Standard defines profiles and the general structure of contact (stylus) instruments for measuring surface roughness and waviness, enabling existing International Standards to be applied to practical profile evaluation. It specifies the properties of the instrument which influence profile evaluation and it provides the basics of the specification of contact (stylus) instruments (profile meter and profile recorder).


1 A data sheet dealing with characteristics of contact (stylus) instruments to be completed by the instrument makers is under preparation and will be introduced in a future standard on calibration procedures.

2 The relationships between the waviness cut-off λf, tip radius and waviness cut-off ratio are under consideration and will be added to this International Standard as an amendment.