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JEDEC JEB 5 Revision A, January 1, 1970
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Methods of Measurement for Semiconductor Logic Gating Microcircuits
Includes all amendments and changes through Reaffirmation Notice , February 1984
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The purpose of this bulletin is to recommend for use in the rating of semiconductor logic gating microcircuits which use the binary states to represent and process logic information. Both static and dynamic measurements are covered.