Hello. Sign In
Standards Store




Look Inside

JEDEC JEP 119

Revision A, August 1, 2003

Complete Document

A Procedure for Performing SWEAT

Includes all amendments and changes through Reaffirmation Notice , October 2012


View Abstract
Product Details
Document History

Detail Summary

Active, Most Current

EN
Format
Details
Price (USD)
PDF
Single User
$57.00
Print
In Stock
$57.00
PDF + Print
In Stock
$79.80 You save 30%
Add to Cart

Product Details:


Description / Abstract:

This document describes an algorithm for performing the Standard Wafer Level Electromigration Accelerated Test (SWEAT) method with computer controlled instrumentation. The algorithm requires a separate iterative technique (not provided) to calculate the force current for a given target time to failure.

This document does not specify what test structure to use with this procedure. However, users of this algorithm report its effectiveness on both straight-lines and via-terminated test structures. Some teststructures design features are provided in JESD87 and in ASTM 1259M - 96.