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JEDEC JEP 65

67th Edition, January 1, 1967

Complete Document

Verification of Maximum Ratings of Power Transistors, Test Procedures for

Includes all amendments and changes through Reaffirmation Notice , April 1999


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Description / Abstract:

This publication describes tests which are intended to represent the verification of maximum ratings for data sheets; they are not tests for performance or quality level. This material is to be used in conjunction with formats developed for device registration and defining data.