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JEDEC JESD 22-A101

Revision D, July 1, 2015

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Steady-State Temperature-Humidity Bias Life Test



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Description / Abstract:

The Steady-State Temperature-Humidity Bias Life Test is performed to evaluate the reliability of nonhermetic packaged IC devices in humid environments. Temperature, humidity, and bias conditions are applied to accelerate the penetration of moisture through the external protective material (encapsulant or seal) or along the interface between the external protective material and the metallic conductors which pass through it.