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JEDEC JESD 22-B108

Revision B, September 1, 2010

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Coplanarity Test for Surface-Mount Semiconductor Devices



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Description / Abstract:

The purpose of this test is to measure the deviation of the terminals (leads or solder balls) from coplanarity at room temperature for surface-mount semiconductor devices. This test method is applicable for inspection and device characterization. If package warpage or coplanarity is to be characterized at reflow soldering temperatures, then JESD22-B112 should be used.